SL-110 Carrier Lifetime Measurement System is used to measure the minority carrier lifetime in a solar cell by using Open Circuit voltage Decay (OCVD) method and Reverse Recovery Transient (RRT) method. This is a unique system which consists of an inbuilt square wave generator (used for RRT method), a solar cell, LED (flash/light source), and an optional connectivity to PC (via USB).
- Built-in AC square wave generator required for RRT method.
- LCD (16x2) display for indications.
- USB connectivity to acquire values of V_oc in OCVD method to PC for analysis.
- BNC cables & connectors for noise free signal output.
Scope of Learning
To measure the open circuit voltage decay of a crystalline silicon solar cell.
To measure the reverse recovery transient of the solar cell.
To calculate the lifetime of the solar cell by the two methods.
To understand the concept of lifetime in solar cells.
To understand the relation between open circuit voltage decay and lifetime in a solar cells.
To understand the reverse current generated cell due to minority carriers and storage time of carriers in solar cells.
Ability to measure and calculate the lifetime of carriers in solar cells.