Semiconductor C-V Characteristic Analyzer

Product Description

TH510 Series Semiconductor C-V Characteristic Analyzers are advanced instruments designed for parasitic capacitance testing and C-V analysis of semiconductor devices, offering frequency coverage from 1 kHz to 2 MHz, Vgs range up to ±40 V, and Vds range options of 200 V, 1500 V, or 3000 V. They feature a 10.1-inch capacitive touchscreen, Linux-based dual CPU architecture, and support up to 6 test channels.

Key Features

• Frequency range: 1 kHz – 2 MHz
• Measured parameters: Ciss, Coss, Crss, Rg (all displayed simultaneously)
• Voltage ranges: Vgs: 0 – ±40 V , Vds: 0 – 200 V / 1500 V / 3000 V
• Touchscreen display: 10.1-inch capacitive, 1280×800 resolution
• CPU architecture: Dual CPU, fastest LCR test speed 0.56 ms
• Test methods: Spot test, list scan, graphic scan (optional)
• Channel configuration: Standard 2-channel, expandable to 6 channels